1 |
v. 5
Defects and diffusion in solids : an introduction / Stanisław Mrowec ; [translated by Stefan Marcinkiewicz]
Amsterdam ; New York : Elsevier Scientific. - Warszawa : Polish Scientific. - New York : distribution for the U.S.A. and Canada, Elsevier/North-Holland , 1980
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2 |
14
Sintering--theory and practice : proceedings of the 5th International Round Table Conference on Sintering, Portoroz̆, Yugoslavia, September 7-10, 1981 / edited by D. Kolar, S. Pejovnik, and M.M. Ristić
Amsterdam ; New York : Elsevier Scientific Pub. Co.. - New York, N.Y. : Distributors for the United States and Canada Elsevier Science Pub. , 1982
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3 |
21
Interrelations between processing, structure, and properties of polymeric materials : proceedings of the IUPAC International Symposium on Interrelations Between Processing, Structure, and Properties of Polymeric Materials, Athens, Greece, August 29-September 2, 1982 / edited by James C. Seferis, Pericles S. Theocaris
Amsterdam ; Tokyo : Elsevier. - New York, N.Y. : Elsevier Science Pub. Co. [distributor] , 1984
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4 |
40
Electron microscopy in solid state physics / edited by H. Bethge and J. Heydenreich
Amsterdam ; Tokyo : Elsevier , 1987
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5 |
44
Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987 / edited by Eicke R. Weber
Amsterdam ; Tokyo : Elsevier , 1987
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6 |
46
Basic mechanisms in fatigue of metals : proceedings of the International Colloquium "Basic Mechanisms in Fatigue of Metals" / organized in memory of the late Professor Mirko Klesnil by the Institute of Physical Metallurgy, Czechoslovak Academy of Sciences in Brno, 12-14 April 1988 ; edited by P. Lukáš and J. Polák
Amsterdam ; Tokyo : Elsevier. - Prague : Academia , 1988
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7 |
79
Radiation damage of structural materials / Jaroslav Koutský and Jan Kocík
Amsterdam ; New York : Elsevier , 1994
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8 |
80
Structure and properties of ceramics / edited by Aleš Koller
Amsterdam : Elsevier , 1994
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