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RT Book, Whole SR Print DC OPAC T1 EVOLUTION OF OXIDATION AND CREEP DAMAGE MECHANISMS IN HIPED SILICON NITRIDE MATERIALS / WERESZCZAK, A.A.// FERBER, M.K.// KIRKLAND, T.P.// MORE, K.L. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES)) T2 CONF A1 WERESZCZAK, A.A. A1 FERBER, M.K. A1 KIRKLAND, T.P. A1 MORE, K.L. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES)) YR 1994 FD 1994 SP 14 LA English (英語) NO 書誌ID=1000714610; LK [OPAC]https://library-documents.jaea.go.jp/opac/opac_link/bibid/1000714610 OL 30