JAEA図書館を検索します。
CiNii Booksを検索します。
CiNii Research(論文)を検索します。
IRDBを検索します。
PubMedを検索します。
NDLサーチを検索します。
機構内の蔵書を検索した結果です。電子媒体は詳細画面から外部へリンクする事が可能です。 ※なお、機構が購読する電子ジャーナル・電子ブックの本文の閲覧は原則として機構内からの利用となります。 機構職員等で、機構外からの電子ジャーナル等の利用について確認されたい方はこちら(機構内でのみ閲覧可能)をご確認ください。
検索キーワード:(著者名に左の語を含む: #PENNYCOOK S.J.)
該当件数:73件
ATOMIC STRUCTURE AND PROPERTIES OF GRAIN BOUNDARIES IN CERAMICS THROUGH / PENNYCOOK,S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES).)
, 1996. - (CONF ; CONF-9609246-1)
レポート
Z-CONTRAST IMAGING AND GRAIN BOUNDARIES IN SEMICONDUCTORS / CHISHOLM, M.F.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1996. - (CONF ; CONF-960860-3)
ATOMIC RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE / BROWNING, N.D.// CHISHOLM, M.F.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1993. - (CONF ; CONF-930755-3)
APPLICATION OF Z-CONTRAST IMAGING TO OBTAIN COLUMN-BY-COLUMN SPECTROSCOPIC ANALYSIS OF MATERIALS / BROWNING, N.D.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1993. - (CONF ; CONF-921101-125)
ION BEAM ANNEALING OF GA-IMPLANTED SI / WITHROW, S.P.// HOLLAND, O.W.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1989. - (CONF ; CONF-890579-1)
DIRECT EXPERIMENTAL DETERMINATION OF THE ATOMIC STRUCTURE AT INTERNAL INTERFACES / BROWNING, N.D.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1995. - (CONF ; CONF-9504229-1)
DIRECT ATOMIC RESOLUTION IMAGING OF DISLOCATION CORE STRUCTURES IN A 300 KV STEM / MCGIBBON, A.J.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1995. - (CONF ; CONF-9503125-3)
SELF-LIMITING GROWTH KINETICS OF 3D COHERENT ISLANDS / CHEN, K.M.// JESSON, D.E.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1995. - (CONF ; CONF-951155-111)
ATOMIC SCALE STRUCTURE AND CHEMISTRY OF INTERFACES BY Z-CONTRAST IMAGING AND ELECTRON ENERGY LOSS SPECTROSCOPY IN THE STEM / MCGIBBON, M.M.// BROWNING, N.D.// CHISHOLM, M.F.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1993. - (CONF ; CONF-940412-4)
DIRECT DETERMINATION OF GRAIN BOUNDARY ATOMIC STRUCTURE IN SRTIO/SUB 3/ / MCGIBBON, M.M.// BROWNING, N.D.// MCGIBBON, A.J.// CHISHOLM, M.F.// PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1994. - (CONF ; CONF-941144-102)
HIGH-RESOLUTION IMAGING IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE / PENNYCOOK, S.J.// JESSON, D.E. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1992. - (CONF ; CONF-9110359-1)
HIGH-RESOLUTION Z-CONTRAST IMAGING OF SUPERLATTICES AND HETEROSTRUCTURES / PENNYCOOK, S.J.// JESSON, D.E.// CHISHOLM, M.F. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1991. - (CONF ; CONF-910322-2)
DIRECT IMAGING OF ORDERING IN SI-GE ALLOYS, ULTRATHIN SUPERLATTICES, AND BURIED GE LAYERS / JESSON, D.E.// PENNYCOOK, S.J.// BARIDEAU, J.M. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1991. - (CONF ; CONF-910406-23)
COLUMN-BY-COLUMN COMPOSITIONAL IMAGING BY Z-CONTRAST STEM / PENNYCOOK, S.J.// JESSON, D.E.// CHISHOLM, M.F. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1992. - (CONF ; CONF-920819-4)
STRUCTURAL CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES BY ATOMIC RESOLUTION Z-CONTRAST IMAGING AT 300KV / MCGIBBON, A.J.// PENNYCOOK, S.J.// WASILEWSKI, Z. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1993. - (CONF ; CONF-931108-68)
HIGH-RESOLUTION IMAGING OF SEMICONDUCTOR INTERFACES BY Z-CONTRAST STEM / PENNYCOOK, S.J.// JESSON, D.E.// CHISHOLM, M.F. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1989. - (CONF ; CONF-890462-1)
Z-CONTRAST IMAGING OF CATALYSTS IN THE 300 KV STEM / PENNYCOOK, S.J.// JESSON, D.E.// LIU, D.R. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1995. - (CONF ; CONF-950892-2)
SHALLOW JUNCTION FORMATION IN AS-IMPLANTED SI BY LOW-TEMPERATURE RAPID THERMAL ANNEALING / EL-GHOR, M.K.// PENNYCOOK, S.J.// ZUHR, R.A. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1989. - (CONF ; CONF-890426-28)
INCOHERENT IMAGING BY Z-CONTRAST STEM: TOWARDS 1A RESOLUTION / PENNYCOOK, S.J.// JESSON, D.E.// MCGIBBON, A.J. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))
, 1993. - (CONF ; CONF-931108-62)
COMPOSITIONAL IMAGING OF SEMICONDUCTOR INTERFACES BY Z-CONTRAST SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM) / PENNYCOOK, S.J.// JESSON, D.E.// CHISHOLM, M.F. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1990. - (CONF ; CONF-901105-11)