JAEA図書館を検索します。
CiNii Booksを検索します。
CiNii Research(論文)を検索します。
IRDBを検索します。
PubMedを検索します。
NDLサーチを検索します。
機構内の蔵書を検索した結果です。電子媒体は詳細画面から外部へリンクする事が可能です。 ※なお、機構が購読する電子ジャーナル・電子ブックの本文の閲覧は原則として機構内からの利用となります。 機構職員等で、機構外からの電子ジャーナル等の利用について確認されたい方はこちら(機構内でのみ閲覧可能)をご確認ください。
検索キーワード:(著者名に左の語を含む: #PENNYCOOK S.J.)
該当件数:73件
TRANSIENT ENHANCED DIFFUSION IN ION-IMPLANTED SILICON. / PENNYCOOK, S.J.(et al.)
, 1987. - (CONF ; CONF-870385-7)
レポート
Z-CONTRAST IMAGING OF DOPANT PRECIPITATION AND REDISTRIBUTION DURING SOLID AND LIQUID PHASE EPITAXIAL GROWTH OF ION-IMPLANTED SI. / PENNYCOOK, S.J.(et al.)
, 1987. - (CONF ; CONF-870462-1-DRAFT)
COMBINED EXPERIMENTAL AND THEORETICAL APPROACH TO ATOMIC SCALE CHARACTERIZATION. / PENNYCOOK, S.J.(et al.)
: Oak Ridge National Laboratory(Oak Ridge National Laboratory) , 1998. - (ORNL ; ORNL/CP-96679; DE98004976)
COMMENTS ON THE IMAGE CONTRAST FROM INELASTICALLY SCATTERED ELECTRONS. / PENNYCOOK, S.J.
, 1984. - (CONF ; CONF-8404190-3)
STRUCTURAL AND CHEMICAL IMAGING OF SUPERCONDUCTORS AND SEMICONDUCTORS BY HIGH-RESOLUTION STEM. / PENNYCOOK, S.J.
, 1989. - (CONF ; CONF-881155-48)
DIRECT IMAGING OF THE ATOMIC STRUCTURE AND CHEMISTRY OF DEFECTS AND INTERFACES BY Z-CONTRAST STEM (SCANNING TRANSMISSION ELECTRON MICROSCOPY) / PENNYCOOK, S.J.(et al.)
, 1990. - (CONF ; CONF-891119-108)
IMPURITY ATOM LOCATION USING AXIAL-ELECTRON-CHANNELING. / PENNYCOOK, S.J.
, 1987. - (CONF ; CONF-870588-1-DRAFT)
DETERMINATION OF INTERFACE STRUCTURE AND BONDING AT ATOMIC RESOLUTION IN THE STEM / PENNYCOOK, S.J.(et al.)
, 1994. - (CONF ; CONF-940753-17)
ATOMIC-SCALE STRUCTURES IN COMPLEX SOLIDS BY Z-CONTRAST STEM AND FIRST- PRINCIPLES THEORY. / PENNYCOOK, S.J.(et al.)
: Oak Ridge National Laboratory(Oak Ridge National Laboratory) , 1998. - (ORNL ; ORNL/CP-97024; DE98005720)
ENHANCED DIFFUSION FROM INTERSTITIAL TRAPPING DURING SOLID-PHASE-EPITAXIAL GROWTH OF SILICON ALLOYS. / PENNYCOOK, S.J.(et al.)
, 1984. - (CONF ; CONF-8407102-1-DRAFT)
HIGH RESOLUTION Z-CONTRAST IMAGING AND LATTICE LOCATION ANALYSIS OF DOPANTS IN ION-IMPLANTED SILICON. / PENNYCOOK, S.J.(et al.)
, 1984. - (CONF ; CONF-841157-57)
(MICROSCOPY OF SEMICONDUCTING MATERIALS). / PENNYCOOK, S.J.
: Oak Ridge National Laboratory(Oak Ridge National Laboratory) , 1991. - (ORNL ; ORNL/FTR-3884)
ATOMIC SCALE IMAGING OF THE STRUCTURE AND CHEMISTRY OF SEMICONDUCTOR INTERFACES / PENNYCOOK, S.J.(et al.)
, 1990. - (CONF ; CONF-900302-1)
ATOM LOCATION BY ELECTRON CHANNELING ANALYSIS. / PENNYCOOK, S.J.
, 1984. - (CONF ; CONF-840767-17-DRAFT)
STUDIES OF SEGREGATION BY Z-CONTRAST STEM. / PENNYCOOK, S.J.
, 1988. - (CONF ; CONF-880841-9)
Z-CONTRAST IMAGING AND ELECTRON CHANNELING ANALYSIS OF DOPANTS IN SEMICONDUCTORS. / PENNYCOOK, S.J.(et al.)
, 1985. - (CONF ; CONF-8503131-2)
TRANSIENT ENHANCED DIFFUSION AND GETTERING OF DOPANTS IN ION IMPLANTED SILICON. / PENNYCOOK, S.J.(et al.)
, 1984. - (CONF ; CONF-841157-98)
ATOMIC-SCALE ORIGINS OF GRAIN BOUNDARY SUPERCONDUCTING PROPERTIES. / PENNYCOOK, S.J.(et al.)
: Oak Ridge National Laboratory(Oak Ridge National Laboratory) , 1998. - (ORNL ; ORNL/CP-96745; DE98005588)
INNER-SHELL EXCITATION BY CHANNELED ELECTRONS. / PENNYCOOK, S.J.
, 1988. - (CONF ; CONF-8804141-7)
DIFFUSION, SEGREGATION, AND RECRYSTALLIZATION IN HIGH-DOSE ION-IMPLANTED SI / PENNYCOOK, S.J. (OAK RIDGE NATIONAL LAB., TN (USA))
, 1989. - (CONF ; CONF-890426-27)